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| Microscopy and Microanalysis » Instrumentation » TEM | ||
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Transmission electron microscopy (TEM) Thanks to the duality of quantum physics, which states that any particle, including an electron, can have both wave and particle properties, electrons can be used instead of photons to produce an image. Since electrons can have much higher energy than photons, they can also have much smaller wavelengths. The resolution can therefore be drastically improved compared to that of an optical microscope. In a transmission electron microsope (TEM) a beam of electrons is emitted from an electron gun. The electrons are then accelerated to an energy of 100-200 keV (compared to a few eV for photons). The beam is refined and lead to the specimen via an array of magnetic lenses and is transmitted through the sample. The beam then creates an image of the specimen, or a diffraction pattern, after another set of lenses. We have two TEMs: Philips CM200 JEOL 2000FX |
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