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| Microscopy and Microanalysis » Instrumentation » SEM » FEI Quanta 200 ESEM FEG | ||
| FEI Quanta 200 ESEM FEG The Quanta 200 ESEM FEG from FEI is a special type of high performance scanning electron microscope (SEM). It is equipped with a Schottky field emission gun (FEG) for optimal spatial resolution. The instrument can be used in high vacuum mode (HV), low-vacuum mode (LV) and the so called ESEM (Environmental SEM) mode.This makes it possible to study samples in pressures up to 5 Torr. The microscope is equipped with an Oxford Inca Energy Dispersive X-ray (EDX) system for chemical analysis. Qualitative and quantitative analysis, elemental mapping and linescans can be performed. The microscope can also be equipped with a peltier stage for studies of wet samples in-situ. There are two heating stages available for in-situ heating experiments up to 1500°C. This can be done in combination with having an external gas present in the chamber, e.g. air, for studying chemical reactions, such as oxidation, at high temperatures. Instrument data: 30 kV: 2.0 nm 15 kV: 2.1 nm 8 kV: 2.5 nm 3 kV: 3.5 nm 1 kV: 5 nm 500 V: 7 nm (at 7 mm) Operating voltage: 0,5-30kV Gun: Field emission gun (FEG) Equipped with: Oxford Inca 300 EDX system, Peltier stage (-20°C - +100°C)  |
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