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| Microscopy and Microanalysis » Instrumentation » SEM | ||
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Scanning electron microscopy (SEM) Thanks to the duality of quantum physics, which states that any particle, including an electron, can have both wave and particle properties, electrons can be used instead of photons to produce an image. Since electrons can have much higher energy than photons, they can also have much smaller wavelengths. The resolution can therefore be drastically improved compared to that of an optical microscope. In a scanning electron microscope, the electron beam is scanned across the surface of interest. The impact of the beam with the surface generates a cascade of electrons that are scattered in all directions. The amount of electrons generated at the surface, and their energy, depend on the topography and on the elements that the analyzed material consists of. Thus, both topographic and elemental information can be obtained. We have two SEMs: Leo Ultra 55 FEG FEI Quanta 200 ESEM FEG |
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