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APFIM  
Microscopy and Microanalysis » Instrumentation » APFIM » 3D Atom probe
3D Atom probe field ion microscope
 

Instrument data:





2012
Jan
1S52
2M1
3T
4O
5T
6F
7L
8S
9M2
10T
11O
12T
13F
14L
15S
16M3
17T
18O
19T
20F
21L
22S
23M4
24T
25O
26T
27F
28L
29S
30M5
31T
Feb
1O
2T
3F
4L
5S
6M6
7T
8O
9T
10F
11L
12S
13M7
14T
15O
16T
17F
18L
19S
20M8
21T
22O
23T
24F
25L
26S
27M9
28T
29O
Mar
1T
2F
3L
4S
5M10
6T
7O
8T
9F
10L
11S
12M11
13T
14O
15T
16F
17L
18S
19M12
20T
21O
22T
23F
24L
25S
26M13
27T
28O
29T
30F
31L
www.fy.chalmers.se
www.chalmers.se
Microscopy and Microanalysis
Applied Physics

Chalmers University of Technology
SE-412 96  Göteborg
Visiting address: Fysikgränd 3, ground floor
Tel 031-772 5473
Last modified: 2009-11-27

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