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Atom probe field ion microscopy (APFIM)
The atom probe is an instrument of analysis with atomic resolution. During the analysis, atoms are pulled off, by field evaporation, from the specimen and mass analysed by a mass spectrometer. In order to achieve field evaporation a DC voltage is applied on a conductive, needle-shaped specimen, with a radius between 50nm to 100 nm.
The analysed volume is cone shaped, typically with a diameter of 2-15 nm and a length up to several hundred nanometres. The 3-dimensional atom probe (3DAP) has a position sensitive detector, which gives the possibility of reconstructing the analysed volume in three dimensions, with special software. In the 1-dimensional atom probe (1DAP), the diameter is only a few nanometres and the chemical identity is only determined in one dimension (depth profile).
By introducing noble gas (Ne, He) into the chamber of analysis, field ion microscopy can be conducted. When the DC voltage is applied to the specimen, the gas atoms are ionized at the specimen surface. The ionized atoms are projected radially to a screen where the field ion image is formed. This technique has a magnification in the order of one million times and the images have an atomic resolution
We have two APFIMs:
1DAP
3DAP
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2009 |
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Okt 1T 2F 3L 4S  5M41 6T 7O 8T 9F 10L 11S  12M42 13T 14O 15T 16F 17L 18S  19M43 20T 21O 22T 23F 24L 25S  26M44 27T 28O 29T 30F 31L |
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Nov 1S  2M45 3T 4O 5T 6F 7L 8S  9M46 10T 11O 12T 13F 14L 15S  16M47 17T 18O 19T 20F 21L 22S  23M48 24T 25O 26T 27F 28L 29S  30M49 |
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Dec 1T 2O 3T 4F 5L 6S  7M50 8T 9O 10T 11F 12L 13S  14M51 15T 16O 17T 18F 19L 20S  21M52 22T 23O 24T 25F 26L 27S  28M53 29T 30O 31T |
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